ADCs: Tackling Design, Verification and Characterization Challenges of High-Performance, High-Accuracy, Low-Power Data Converters
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This presentation explores the design, verification, and silicon data
performance of an Analog Bits Low Power SerDes fabricated in TSMC
16FFC process technology and verified using the AFS Platform.
This paper examines circuit types that most commonly require transient noise
analysis. It then demonstrates Siemens’ Analog FastSPICE eXtreme (AFS XT) tool’s
runtime performance data for these circuit types.
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