On-Demand Webinar

Using critical-area weighted optimization for more effective test patterns

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The world of ATPG changed with the introduction of a new solution that can calculate the critical-area effectiveness of each test pattern. Knowing the likelihood of detecting defects based on their critical area, combined with pattern sorting between various pattern sets, lets users choose the most effective test patterns to apply.

You will learn:

  • How critical area can optimize the selection of the most effective patterns from various pattern sets

  • An automated simple process to determine the best patterns to apply when truncating

  • Silicon value seen with some new types of patterns

  • How to apply the patterns that are most like to detect defects first

  • The value of creating patterns for multiple fault models in one ATPG pass

This on-demand, one-hour, online seminar is presented by Tessent DFT expert Ron Press.