Webinar

New Tools to Accelerate Silicon Debug and Bring-Up

On-demand

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Learn how to overcome new chip bring-up issues by viewing this webinar presented by experts from two of the leaders in system-on-chip (SoC) design for test (DFT) and automated test equipment (ATE). The speakers will discuss IJTAG ATE debug using Tessent tools and Teradyne’s UltraFLEX ATE.

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