Tower Semiconductor: An Approach to Reliability Analysis of Std Cells using mPower
This session presents a unified approach combining Standard Cell characterization and EM/IR analysis into a single, streamlined flow. This allows leveraging the outputs generated during Standard Cell Characterization to perform the EM/IR analysis for the whole Standard Cell library. This unique integration is done by using Siemens’s Solido Characterization suite for Characterization, and Siemens’s mPower for EM/IR analysis. The integration helps the user automatically generate the necessary inputs for EM/IR analysis, as well as automatic selection of the worst-case scenario from an EM/IR perspective. This avoids potential human errors and gives a high confidence in the results. This integration ensures accurate analysis while maintaining consistency across characterization and reliability verification, paving the way for faster and more robust IC development.
Relatore
Glen Farnsworth
Manager Design Automation
Glen has worked for over 40 years in the semiconductor industry. A software engineer by education, his early years were spent integrating diverse tools to create design environments. As vendors took over that role, he moved into specialty tool development, focusing on such tasks as analog layout automation and substrate analysis. Eventually Glen spent a short time as a field AE with an EDA vendor, before returning to the design support role with a semiconductor design company. During a short hiatus as a software contractor, Glen learned skills and tools related to project management. In 2013 Glen was hired by Jazz Semiconductor, in the role of Manager Design Automation. Jazz merged with Tower Semiconductor, where Glen continued in that role, becoming part of a worldwide team.