Chain diagnosis improvements for the age of backside power

Scan chain diagnosis has long been used to identify manufacturing defects and yield issues in early ramp. Identifying and eliminating these yield issues quickly and efficiently are required to ensure business success of a product. Root-causing defect mechanisms that produce yield loss require a combination of fault isolation and failure analysis. The advent of new technologies, like backside power in advanced process nodes, have made fault isolation extremely challenging. In this webinar, we describe three new software-based technologies that provide accurate localization to enable efficient failure analysis of both front-end and back-end line defects. We also present results for each of these techniques. These technologies can alleviate the pressure on fault isolation for front-end of line defects and provide reduced area for back-end of line defects for Physical Failure Analysis (PFA).

What can you learn from this webinar:

• Scan technology
• Chain diagnosis
• Directed FA using scan chain diagnosis
• Global signal diagnosis
• Cell-aware chain diagnosis
• Layout-aware chain diagnosis
• Yield improvement using directed FA

Who would benefit most from the content in this webinar:

• Product engineers using scan diagnosis data
• Yield analysts
• Fault isolation engineers, failure analysis engineers