Tower Semiconductor: Bridging Characterization and EM/IR Analysis: An Approach to Reliability Analysis of Standard cells
This session presents a unified approach combining characterization and EM/IR analysis into a single, streamlined flow, which allows leveraging of the outputs generated during Standard Cell’s Characterization to perform the EM/IR analysis for the whole Standard Cell’s library. This unique integration is done by using Siemens’s Solido Characterization suite (for Characterization) and Siemens’s mPower (for EM/IR analysis) tools. The integration helps the user automatically generate the necessary inputs for EM/IR analysis as well as allows to select the worst-case scenario automatically from an EM/IR perspective. This allows us to avoid potential human mistakes and have high confidence in the results. The integration ensures accurate analysis while maintaining consistency across characterization and reliability verification, paving the way for faster and more robust IC development.
À propos de l'intervenant
Ofer Tamir
Managing Director Design Enablement & Support
Ofer has a MA degree in Mathematics & computer science. Work in the industry more than 35 years in Design Enablement and CAD software development and managing in companies like National Semiconductor (Now TI), DSPG and for the last 24 yeas at Tower’s.
At Tower’s, Managing the Design embalmment department – development of Design kits, Support the design flows internally and externally by the CAD team and Design customer support for all design and PDK related topics. Corporate with all EDA vendors for reference design and flows to leverage Tower deliveries and EDA design flow for first time success design by customers.