As the Semiconductor industry continues to change and evolve, requirements for test continue to extend from manufacturing into in-system as part of a growing SLM strategy. The growing need to increase the quality of in-system testing capabilities is driving a shift in technology.
Thanks to new innovation, it is now possible to apply manufacturing quality test patterns direct to a design, leveraging the benefits of deterministic test over transitional in-system test methods.
This webinar will cover the motivations and benefits of using in-system deterministic test and how using this new technology can become a central part of any SLM strategy.
Who should attend:
What you will learn:
Required knowledge (advised but not essential)
Director of Product Marketing, Tessent
Lee Harrison is Director, Product Marketing, with Siemens Tessent Division. He has over 25 years of industry experience with Siemens Tessent DFT products and is involved in the specification of new test features and methodologies for Siemens customers, delivering high quality DFT solutions. With a focus on safety and security, Lee is working to ensure that current and future DFT requirements of Siemens’s customers are understood and met. Lee received his BEng in MicroElectronic Engineering from Brunel University London in 1996. Lee presents regularly at industry conferences such as DAC, ITC, VTS, ETS, DATE etc.