This Webinar focuses on presenting our integrated flow addressing the challenges of prototyping to Signoff for FOWLP, 2.5/3D stacked die designs and other emerging technologies with SI/PI/Thermal/DRC and LVS checks
The outburst of IC package complexity drives multiple logic devices and HBM that are integrated using high-performance substrates enabling very high wiring densities and interconnect performance. Monolithic scaling limitations are driving the growth of 2.5/3D multi-die heterogeneous and homogeneously integrated technologies allowing PPA targets to be met. This complexity requires a new design methodology and approach that starts with a focus on integration planning and prototyping where multiple scenarios can be explored and analyzed before any actual Interposer/substrate place and route takes place.
This Webinar focuses on presenting our integrated flow addressing the challenges of prototyping to Signoff for FOWLP, 2.5/3D stacked die designs and other emerging technologies with SI/PI/Thermal/DRC and LVS checks
Application Consultant
Field Application Engineer
Field Application Engineer