Incremental O-RAN Testing with 50G X-STEP EVA

Webinar Overview

The webinar will explain how to use Siemens X-STEP EVA O-RAN tester as a versatile tool through product development cycle.

Special emphasis is put to understand early bring-up phase operation, where X-STEP has unique capabilities. The tool offers visibility and configurability for testing each functionality in an isolated and independent manner. X-STEP’s technology enables bit-accurate analysis of broken communication links and nanosecond timing accuracy.

The webinar also discusses O-RAN testing after bring-up.

X-STEP EVA can generate and capture high volume traffic in O-RAN User plane, as well as the related Control plane. Management and Synchronisation planes have a variety of run-time controls for such operations as O-RU configuration and PTP synchronisation.

X-STEP EVA support 10, 25 and 50Gbps link rate testing for up to four simultaneous links. This is a significant cost-reduction for automated testing of several O-RAN devices such as O-RU.

The webinar will walk through these ideas, and the participants will gain a good understanding of the incremental approach which serves their projects well through their development cycle.

What you will learn:

• Techniques for early bring-up of O-RAN devices
• Insights into interoperability testing
• Versatile 10/25/50G link testing with several links
• Test automation and integration to test environment

Who should attend

• Engineering Manager
• Application Engineer
• FPGA Design Engineer
• SW Designer