Product testing is often considered late in the design process, with little thought provided to testing methods, particularly during component layout. In reality, this is the ideal time to consider it.
In this 30 minute webinar, you will learn how to optimize your design for test and inspection with Valor NPI. Learn how lowering your yield early in testing ensures that expensive functional yields are higher.
In addition, we will discuss:
- How to avoid the shadowing impact in AOI
- How to improve the test coverage in ICT test
- How to reduce expensive costs in functional test
- Best practice to optimize your test process