Achieving High Defect Coverage for Safety Critical and High Reliability Designs

Designing IC’s for autonomous vehicles is challenging and requires new system architectures optimized for artificial intelligence and machine learning. In addition, the complexity of safety-critical designs requires tools and tool flows that can assure companies that their designs meet the requirements of the ISO 26262 standard as well as prove they reach sufficient defect coverage during manufacturing test.

In this session you will gain an understanding of how Siemens EDA provides practices, methodologies and integrated tool flows that provides a path to reaching the required manufacturing test quality needed for designs targeted at critically safe and high reliability markets and helps accelerate product development to meet time-to-market pressures.

What you will learn:

• The challenges of achieving high defect coverage
• Addressing coverage for all fault types
• A methodology to accelerate time-to-coverage

Who should attend:

• Design & Verification Engineers & Managers and those interested in
  design for test and functional fault grading